LM Gauge EVOH
LM Gauge EVOH (Barrier Layer Measurement)
This non-contact thickness measuring device is for film and sheet up to a total thickness of 3 mm. It is equipped with dual technology to measure total thicknesss and also the individual barrier layer thickness (example, EVOH, BVOH, Nylon).
|Up to 3 mm
|> 5 µm*
|≤ 0.1 µm
|≤ ± 0.5 µm
|≤ 2 µm*
|10-300 mm/s adjustable
|25 mm/s adjustable
|necessary for each material
*Depending on product and calibration.
Specialized electronics like power supply, sensors, amplifiers are engineered for precise measurement.
X-ray tube can be switched off. No radioactive isotope emitters
Heavy engineered frame to maximize precision of measurement across a variety of mechanical loads and temperature gradients.
Because of simple calibration technique it is easy to calibrate across a variety of raw materials.