LM Gauge EVOH
LM Gauge EVOH (Barrier Layer Measurement)
This non-contact thickness measuring device is for film and sheet up to a total thickness of 3 mm. It is equipped with dual technology to measure total thicknesss and also the individual barrier layer thickness (example, EVOH, BVOH, Nylon).
|Measuring system||Capacitive/eddy current||Infrared|
|Thickness range||Up to 3 mm||> 5 µm*|
|Measuring gap||4.4 mm||35 mm|
|Sensor resolution||≤ 0.1 µm||0.5 µm|
|Repeatability||≤ ± 0.5 µm||≤ 2 µm*|
|Measurement speed||10-300 mm/s adjustable||25 mm/s adjustable|
|Calibration||necessary for each material|
*Depending on product and calibration.
Specialized electronics like power supply, sensors, amplifiers are engineered for precise measurement.
X-ray tube can be switched off. No radioactive isotope emitters
Heavy engineered frame to maximize precision of measurement across a variety of mechanical loads and temperature gradients.
Because of simple calibration technique it is easy to calibrate across a variety of raw materials.