To use as much plastic as necessary.
Not a micron more. Not a micron less.

LM Gauge EVOH

LM Gauge EVOH (Barrier Layer Measurement)

This non-contact thickness measuring device is for film and sheet up to a total thickness of 3 mm. It is equipped with dual technology to measure total thicknesss and also the individual barrier layer thickness (example, EVOH, BVOH, Nylon).

Product Specification:

Technical DataEKOEVOH
Measuring system Capacitive/eddy current Infrared
Thickness range Up to 3 mm > 5 µm*
Measuring gap 4.4 mm 35 mm
Sensor resolution ≤ 0.1 µm 0.5 µm
Repeatability ≤ ± 0.5 µm ≤ 2 µm*
Measurement speed 10-300 mm/s adjustable 25 mm/s adjustable
Calibration necessary for each material

*Depending on product and calibration.

Product Features

Specialized electronics like power supply, sensors, amplifiers are engineered for precise measurement.

X-ray tube can be switched off. No radioactive isotope emitters

Heavy engineered frame to maximize precision of measurement across a variety of mechanical loads and temperature gradients.

Because of simple calibration technique it is easy to calibrate across a variety of raw materials.


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