Thickness Measurement Systems
LM Gauge EKO
LM Gauge EKO features a dual sensor system for non-contact measuring of films and sheets up to 6 mm thick – with extreme accuracy.
LM Gauge EKO is a non–nuclear technology that does not require licensing or protection guards.
LM Gauge EVOH (Barrier Layer Measurement)
Non-Contact Thickness Measuring Device for Barrier Sheet
LM Gauge X-Ray
LM Gauge X-Ray is low energy x-ray gauging system (< 5kVA) that measures thickness and basis weight of thin films such as cast films, non-woven and other flexible packaging.
Due to low output voltage, LM Gauge X-Ray does not require licensing in most countries leading to easy installation and maintenance.
LM Gauge Shadow
LM Gauge Shadow is a readily used direct measuring system for the systems in which films up to 3,5mm are produced.
LM Gauge Shadow works on the principle of laser occlusion over a measuring roller. It is a direct measuring system, and it is, therefore, independent of the properties of the film.
LM Gauge Laser Triangulation
LM Gauge Laser Triangulation was developed for thick rigid panels upto 40 mm. Two laser distance sensors scan the distance to the surface above and below a plate that runs through an O-frame. This directly determines the thickness of the plate.
LM Gauge Laser Triangulation is a non–nuclear technology that does not require licensing or protection guards.